Prof. Rasheed M. A. Azzam

Department of Electrical Engineering

University of New Orleans, New Orleans, Louisiana

Location:  CREOL, Room 103  &  Time: 11:00am - 12:00 pm, July 20

Abstract:

The differential reflection of p- and s-polarized light by interfaces and thin films is central to the theory and applications of ellipsometry.  It is also the basis of a wide variety of optical devices for the control and analysis of polarized light such as polarizers, polarizing and polarization-preserving beam splitters, and quarter-wave and half-wave retarders.  New insight into the correlation between complex refractive indices of film and substrate materials and reflection properties is emphasized.

Biography:

Rasheed Azzam, Distinguished Professor of Electrical Engineering at the University of New Orleans, is Fellow of OSA, SPIE, and TWAS: Academy of Sciences of the Developing World (Trieste, Italy).  Dr. Azzam received SPIE’s 2005 G. G. Stokes Award for exceptional contributions to polarization optics.  He served as topical editor of both Applied Optics and Journal of the Optical Society of America A, and was guest editor of special issues of Journal of the Optical Society of America A, Optical Engineering, Surface Science, and Vol. 27 of SPIE's Milestone Series Selected Papers on Ellipsometry.  Dr. Azzam was co-organizer, co-chairman, and proceedings co-editor of several conferences on ellipsometry, polarized light, and optical polarimetry. He was recognized as an Outstanding American Inventor by Intellectual Property Owners, Inc., for his four‑detector photopolarimeter.  This invention, which led to the commercial development of the StokesMeter® by Gaertner Scientific, received a Photonics Circle of Excellence Award and one of the R&D 100 Awards.  Dr. Azzam was a Fulbright Scholar and Visiting Professor at Université de Provence (France).  He holds 5 US patents, and is author or co-author of 3 book chapters and over 250 papers.  His monograph Ellipsometry and Polarized Light (published by North-Holland) has been translated to several languages.

For more information, please contact us by zge@mail.ucf.edu